Abstract

The papers published in these peer-reviewed proceedings represent the latest developments in nondestructive characterization of materials and were presented at the Tenth International Symposium on Nondestructive Characterization of Materials held on June 26 - 30, 2000 in Karuizawa, Japan. The symposium was held concurrently with three other symposia and one workshop. This symposium is the tenth in the series that began in 1983 and became an international meeting in 1986.
The symposium started with a Plenary Lecture entitled 'Application of Non-contact Ultrasonics to Nondestrctive Characterization of Materials' by Professor R.E. Green, Jr. Various characterization methods were presented at the symposium, including ultrasonics, X-ray, eddy currents, laser, thermal wave, acoustic emission, optical fibers, optics, magnetics and ultrasonic microscope. Thin films and coatings as well as smart materials were also emphasized in this symposium.