Morgan Kaufmann
-
-
-
VLSI Test Principles and Architectures
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting (Tim) Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Duncan M. (Hank) Walker, Shianling Wu, Nur A. Touba
-
-
-
-
-
-
-
